MUMBAI, India, Aug. 29 -- Intellectual Property India has published a patent application (202411010670 A) filed by Vdt Pipeline Integrity Solutions Private Limited, Noida, Uttar Pradesh, on Feb. 15, 2024, for 'a compact tool for defect inspection of a tubular structure.'
Inventor(s) include Sharma, Bhuvanesh Kumar; Verma, Raghvendra; and Gupta, Shrey.
The application for the patent was published on Aug. 29, under issue no. 35/2025.
According to the abstract released by the Intellectual Property India: "The present invention relates to a compact tool (100) for defect inspection of a tubular structure. The compact tool (100) comprising: one or primary processors (106) and one or more secondary processors (107) configured to process the data of a first set of sensors (104) and a second set of sensors (108), and store in a memory unit (110); a defect inspection module (109) operably connected to the one or more primary processors (106). The defect inspection module (109) is configured to: detect the distance of the tubular surface from the compact tool (100) through a proximity sensors (104b); detect orientation, position and distance of the compact tool from the tubular structure through one or more inertial measurement unit (108c) and one or more odometer (108a); measure and detect a change in magnetic field due to defect in the tubular structure through the hall sensors (104a)."
Disclaimer: Curated by HT Syndication.
