MUMBAI, India, Jan. 23 -- Intellectual Property India has published a patent application (202511122668 A) filed by Indian Institute Of Technology, Jodhpur, Rajasthan, on Dec. 5, 2025, for 'a method and system for determining verticality parameters of radar for beam pointing alignment.'
Inventor(s) include Sudarsana Jena; and Ankur Gupta.
The application for the patent was published on Jan. 23, under issue no. 04/2026.
According to the abstract released by the Intellectual Property India: "A method and system for determining verticality parameters of radar for beam-pointing alignment is disclosed. The system employs an inertia measurement module mounted in fixed alignment with the radar antenna and acquires reference inclination data alongside orientation values at four rotational positions spaced ninety degrees apart. A processing unit filters and normalizes the acquired orientation values to suppress environmental noise and compensate for sensor drift. The normalized values are transformed using antenna and platform orientation references to generate corrected orientation measurements. Deviations across angularly opposite positions are computed to derive tilt, roll, platform slope, and platform cant parameters. These verticality parameters are subsequently used to generate alignment data containing beam-pointing and geometric-correction values. The invention provides a highly accurate, autonomous, and survey-free solution suitable for rotating phased-array radars, improving alignment reliability across diverse operational environments without reliance on optical metrology or manual adjustment."
Disclaimer: Curated by HT Syndication.
