Intellectual Property India Publishes Patent Application for 'An Automated Conveyor-Based Textile Inspection System Integrating Deep Learning Defect Detection And Color Analysis' Filed by Thapar Institute Of Engineering And Technology

MUMBAI, India, March 13 -- Intellectual Property India has published a patent application (202611010265 A) filed by Thapar Institute Of Engineering And Technology, Patiala, Punjab, on Jan. 31, for 'an automated conveyor-based textile inspection system integrating deep learning defect detection and color analysis.'

Inventor(s) include Amitesh Sharma; Jayant Singh; Jigyasha Gangwal; Manini Vidyarthi; Varun Thakur; Garima Singh; and Sonu Lamba.

The application for the patent was published on March 13, under issue no. 11/2026.

According to the abstract released by the Intellectual Property India: "An Automated Conveyor-Based Textile Inspection System (100) Integrating Deep Learning Defect Detection and Colour Analysis. The system comprising a conveyor belt assembly (110) driven by a motor (112) under the control of a microcontroller (114). An infrared sensor (116) to detect the presence of textile material and triggers image acquisition by a camera module (118) mounted above the conveyor."

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