MUMBAI, India, May 1 -- Intellectual Property India has published a patent application (202641048050 A) filed by Mohan Babu University, Tirupati, Andhra Pradesh, on April 15, for 'disease detection of plant leaves using k-means clustering and cnn algorithms.'
Inventor(s) include Dr. K. S. Chakradhar; and Mr. Naramoyani Munikrishna.
The application for the patent was published on May 1, under issue no. 18/2026.
According to the abstract released by the Intellectual Property India: "Detection of plant leaf disease is crucial for achieving good yields and maintaining crop health. This early identification aids farmers, who may not be familiar with all crop diseases by notifying them so they can take immediate action. This paper presents a system for detecting plant leaf disease using K-Means Clustering and Convolutional Neural Networks (CNN) implemented in MATLAB based on a trained dataset. It includes an Arduino Mega 2560 microcontroller connected to a Camera module for capturing images of plants. Additionally, it monitors environmental factors such as temperature, humidity and soil moisture rate using the DHT11 sensor and Soil Moisture Sensor. These ecological factors can be used for special treatment of crops as per the conditions. After identifying an unhealthy leaf, the system activates the GSM module to send an SMS alert containing the disease name. It makes it easy to recommend pesticides and to take other actions to save crops. This system tackles the challenges of monitoring by combining deep learning, IoT and image processing to provide a practical and scalable solution for improving crop health and boosting agricultural productivity. This work primarily focuses on agriculture as farming is a major sector that directly influences food security, economic stability and the livelihoods of millions. Plant diseases can significantly reduce crop yields and lead to substantial financial losses."
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