MUMBAI, India, March 7 -- Intellectual Property India has published a patent application (202517011459 A) filed by Hitachi Industry & Control Solutions, Ltd., Tokyo, on Feb. 11, for 'inspection device and inspection method.'
Inventor(s) include Katane Tadahiro; Sodeyama Atsufumi; Kiriu Nozomu; Tsushima Kazuki; Shinada Isao; and Kusaka Takahiro.
The application for the patent was published on March 7, under issue no. 10/2025.
According to the abstract released by the Intellectual Property India: "The present invention improves the accuracy of visual inspection. An inspection device (1) comprises: an image processing unit (3) for performing image processing on a video image captured of an inspected object; an AI processing unit (4) for labeling a foreign object captured in a video image of an inspected object on the basis of a learning parameter that has been obtained by learning training data which is a combination of a video image captured of an inspected object and an indicator indicative of whether the inspected object is a non-defective item or a defective item; and a determination unit (7) for determining whether an inspected object is a non-defective item or a defective item on the basis of the video image that has been processed by the image processing unit (3) and a video image that has been labeled by the AI processing unit (4)."
The patent application was internationally filed on June 15, 2023, under International application No.PCT/JP2023/022225.
Disclaimer: Curated by HT Syndication.
