MUMBAI, India, March 7 -- Intellectual Property India has published a patent application (202517013829 A) filed by Samsung Display Co. Ltd., Gyeonggi, Republic of Korea, on Feb. 18, for 'method for detecting cut line of display device.'
Inventor(s) include Lee, Kang Hyuk.
The application for the patent was published on March 7, under issue no. 10/2025.
According to the abstract released by the Intellectual Property India: "The present invention provides a method for detecting a cut line of a display device, the method including the steps of: recognizing a reference mark from an image including a first area extending along an edge of a substrate, a second area located inside the first area, and a background area located outside the first area; designating a measurement area spaced a preconfigured distance away from the reference mark in a boundary direction of the substrate; generating a reference line parallel to the boundary of the substrate within the measurement area; generating a plurality of detection areas within the measurement area; increasing a difference between gray tone values of pixels included in the measurement area; determining a cut point in each of the plurality of detection areas and detecting a cut line based on cut points; and measuring a distance between the cut line and the reference mark."
The patent application was internationally filed on July 12, 2023, under International application No.PCT/KR2023/009979.
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