MUMBAI, India, May 1 -- Intellectual Property India has published a patent application (202641050720 A) filed by Krishna Veni Sahukara; Rachakonda Naga Tejasvi; Mahesh Babu Ammisetty; Veeraswamy Ammisetty; Kasimkota Harshitha; and Nagothi Sanyasirao, Visakhapatnam, Andhra Pradesh, on April 21, for 'multistage test-framework for digital circuits.'
Inventor(s) include Rachakonda Naga Tejasvi; Mahesh Babu Ammisetty; Veeraswamy Ammisetty; Krishna Veni Sahukara; Kasimkota Harshitha; and Nagothi Sanyasirao.
The application for the patent was published on May 1, under issue no. 18/2026.
According to the abstract released by the Intellectual Property India: "Digital circuits are crucial components of the modern electronic devices and their correct functioning and accurate response play a critical role in making the device performance reliable. Conventional methods of testing digital circuits are time-consuming, require more human effort and may not provide accurate results always. In this paper, an Multistage Test-Framework for Digital Circuits is proposed. The system is designed to analyse circuit behaviour, detect faults and improve testing efficiency through automation. The multi-stage approach enhances fault detection accuracy and reduces manual effort. The proposed framework provides a systematic and reliable method for testing digital circuits."
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