MUMBAI, India, July 25 -- Intellectual Property India has published a patent application (202517064511 A) filed by Omicron Electronics Gmbh, Klaus, Austria, on July 7, for 'system, method, and high-voltage test signal device for multifunctional testing of a high-voltage device.'
Inventor(s) include Radler, Michael; and Kaufmann, Reinhard.
The application for the patent was published on July 25, under issue no. 30/2025.
According to the abstract released by the Intellectual Property India: "The invention relates to a test system (10) for multifunctional testing of a high-voltage device (30), said test system comprising a high-voltage test signal device (200), a measuring device (160), and a control device (180). The high-voltage test signal device (200) can, under the control of the control device (180), be operated in a loss factor mode for loss factor testing of the high-voltage device and in an insulation resistance mode for insulation resistance testing of the high-voltage device, meaning that both types of testing can be performed using the same test system."
The patent application was internationally filed on Dec. 18, 2023, under International application No.PCT/EP2023/086292.
Disclaimer: Curated by HT Syndication.
