MUMBAI, India, May 1 -- Intellectual Property India has published a patent application (202641049293 A) filed by Senthilkumar Dhamodharan; and Senthilkumar Balasubiramaniyam, Coimbatore, Tamil Nadu, on April 17, for 'system and method for generating executable automatic test equipment test programs from semiconductor device datasheets.'
Inventor(s) include Senthilkumar Dhamodharan.
The application for the patent was published on May 1, under issue no. 18/2026.
According to the abstract released by the Intellectual Property India: "A system (102) and method for generating Automatic Test Equipment (ATE) test program instructions from semiconductor device datasheets (302) are disclosed. The system (102) extracts structured device parameter data (314) including parameter symbols, numerical values, units, and associated test conditions. A structured dataset with augmented parameter data (412) is generated using normalization, statistical profiling, and generative models (406A, 406B), and validated using electrical and operational constraints. A multi-class multi-label associative classification (MMAC) engine implemented in a classification module (122) classifies the structured device parameter data (314) into one or more test categories based on association rules. An instruction generation module (124) generates platform-specific ATE test program instructions comprising executable test sequences, which are validated using predefined execution constraints. The system (102) transforms semiconductor device datasheets (302) into executable ATE test program instructions while preserving symbol-unit-condition relationships."
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