MUMBAI, India, Nov. 21 -- Intellectual Property India has published a patent application (202517098036 A) filed by Ge Vernova Technology Gmbh; and Ge Infrastructure Technology, Llc, Baden, Switzerland, on Oct. 10, for 'systems and methods for determining a distance to a fault in power systems networks.'
Inventor(s) include Ha, Hengxu; and Li, Xiaoming.
The application for the patent was published on Nov. 21, under issue no. 47/2025.
According to the abstract released by the Intellectual Property India: "The present application provides a method for determining a distance to a fault in a power systems network. The method may involve determining, based on a set of measured voltage samples, a set of processed voltage samples; determining, based on a set of measured current samples, a set of processed reactive current samples, a set of processed resistive current samples, a set of processed negative sequence current samples, and a set of processed zero sequence current samples; selecting, based on an indication from a faulty phase indicator, a selected processed voltage sample, a selected processed reactive current sample, a selected processed resistive current sample, and a selected processed negative or zero sequence current sample; determining, based on the selected processed reactive current sample, that no distortion has occurred due to current transformer (CT) saturation; and calculating, based on the determination that no distortion has occurred, the distance to the fault."
The patent application was internationally filed on Mar. 01, 2024, under International application No.PCT/US2024/018112.
Disclaimer: Curated by HT Syndication.
