Intellectual Property India Publishes Patent Application for 'Ultrasonic Probe For Non-Destructive Testing Of Materials By Means Of Ultrasonic Pulses' Filed by Gilardoni S. P. A.

MUMBAI, India, Sept. 5 -- Intellectual Property India has published a patent application (202344043353 A) filed by Gilardoni S. P. A., Milano, Italy, on June 28, 2023, for 'ultrasonic probe for non-destructive testing of materials by means of ultrasonic pulses.'

Inventor(s) include Rosafio, Matteo; and Sallemi, Damiano.

The application for the patent was published on Sept. 5, under issue no. 36/2025.

According to the abstract released by the Intellectual Property India: "Ultrasonic probe for non-destructive testing of materials by means of ultrasonic pulses comprising a tubular casing (2) provided with at least one semi-annular support (3) comprising a plurality of ultrasonic transducers, an electronic equipment capable of controlling the ultrasonic beams generated by these transducers and to receive and analyse the signals of the returning echoes. Said ultrasonic transducers are angled so that the beam emitted by a first transducer (T1), in the direction of the piece to be checked is refracted inside this material and at the same time reflected by the separation surface (S) between the support and the piece itself generating a first reflected signal (ERS) received by this first transducer (T1), or that the beam emitted by a first transducer (T1) in the direction of the piece is refracted inside this material and at the same time reflected by the separation surface (S) between the support and the piece, transmitted in the direction of a second transducer (T2), or in the direction of an artificial reflector (R1) suitably arranged in the support (3) and further reflected back by said reflector in the direction of this first transducer (T1), the second transducer (T2), or the first transducer (T1) when the artificial reflector is present instead of the second transducer, receiving a second reflected signal (ERT). The electronic equipment is able of calculating at least one characteristic parameter of these first and second reflected signals and comparing said at least one parameter with a pre-set threshold value."

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