MUMBAI, India, Nov. 7 -- Intellectual Property India has published a patent application (202547096508 A) filed by Nokia Technologies Oy, Espoo, Finland, on Oct. 7, for 'validity duration of a carrier phase measurement.'
Inventor(s) include Keating, Ryan; Cha, Hyun-Su; and Joshi, Satya Krishna.
The application for the patent was published on Nov. 7, under issue no. 45/2025.
According to the abstract released by the Intellectual Property India: "A method, apparatus, and computer program product determine, provide, and/or utilize a validity duration of a carrier phase (CP) measurement. The validity duration of a carrier phase measurement enables reuse of certain carrier phase measurements used in a double differential carrier phase (DD-CP) measurement, thereby reducing signaling overhead in certain positioning functions of certain systems. The validity duration of a CP measurement can be implemented at a terminal device, referencing positioning device, network node, location management function, and/or the like, and can be utilized in downlink and/or uplink transmission."
The patent application was internationally filed on Mar. 27, 2024, under International application No.PCT/IB2024/052967.
Disclaimer: Curated by HT Syndication.
