MUMBAI, India, Nov. 14 -- Intellectual Property India has published a patent application (202547096901 A) filed by Koninklijke Philips N. V., Eindhoven, Netherlands, on Oct. 8, for 'x-ray system with modular two-layer detector.'
Inventor(s) include Johnson, Mark Thomas; Vogtmeier, Gereon; Koehler, Thomas; Chaudhury, Sudipta; and Chakrabarti, Biswaroop.
The application for the patent was published on Nov. 14, under issue no. 46/2025.
According to the abstract released by the Intellectual Property India: "The present invention relates to a detection system for an X-ray imaging system. The detection system comprises a first detector a second detector, each detector comprising a detector area and being configured for detecting X-ray radiation emitted by an X-ray source of the X-ray imaging system impinging onto the respective detection area. The detection system is configured to adjust a position of at least one of the first detector and the second detector with respect to the other of the first detector and the second detector. The first detection area of the first detector and the second detection area of the second detector can be positioned at least partially one behind the other with respect to a direction of X-ray radiation emitted from the X-ray source of the X-ray imaging system."
The patent application was internationally filed on Mar. 28, 2024, under International application No.PCT/EP2024/058721.
Disclaimer: Curated by HT Syndication.
