MUMBAI, India, June 24 -- Intellectual Property India has published a patent application (202421096302 A) filed by Ruturaj Puranik on December 06, 2024, for 3d Reflectance Measurement System.
Inventors include Ruturaj Puranik; Ganesh Pawar; Pranav Govekar; Payal Deshmukh; Dr. Nilima Warade; and Dr. Pradeep Mane.
The application for the patent was published on June 12, 2026, under issue no. 24/2026.
Abstract: A 3D reflectance measurement instrument is critical for accurately modelling material interactions with light, essential for enhancing realism in computer vision applications in gaming. This instrument captures comprehensive reflectance data by measuring the Bidirectional Reflectance Distribution Function (BRDF) and Bidirectional Texture Function (BTF) of surfaces. The system integrates a precisely controlled light source and a high-resolution imaging setup, coupled with a robotic arm or goniometer to dynamically alter the incident and viewing angles. Advanced optical components ensure uniform illumination, while sensitive detectors capture reflectance data across a broad spectral range. The device employs efficient algorithms for data acquisition, calibration, and processing, providing a precise digital representation of material textures and reflectance properties. These datasets are invaluable for game developers, enabling the creation of photorealistic environments and objects with lifelike material rendering. By bridging physics-based optics with real time rendering techniques, this instrument contributes to the evolution of immersive gaming experiences.
Disclaimer: Curated by HT Syndication.
