MUMBAI, India, Aug. 10 -- Intellectual Property India has published a patent application (202541006510 A) filed by Hindusthan Institute Of Technology on January 27, 2025, for A Comprehensive Examination On Embedded Deterministic Test And Its Effect On Test Data And Fault Classification.
Inventors include Dr. C. Natarajan; Dr. K. Kalpana; Dr. B. Paulchamy; B. Hakkem; A. Roopasree; and Janarthanan S.
The application for the patent was published on July 31, 2026, under issue no. 31/2026.
Abstract: A COMPREHENSIVE EXAMINATION ON EMBEDDED DETERMINISTIC TEST AND ITS EFFECT ON TEST DATA AND FAULT CLASSIFICATION Test compression was developed to help address this problem. When an ATPG tool ·generates a test for a fault, or a set of faults, only a small percentage of scan cells need to take ' specific values. The rest of the scan chain is don't care, and are usually filled with random values. Loading and unloading these vectors is not a very efficient use of tester time. Test compression takes advantage of the small number of significant values to reduce test data and test time. In general, the idea is to modify the design to increase the number of internal scan chains, each of shorter length. These chains are then driven by an on-chip decompressor, usually designed to allow continuous flow decompression where the internal scan chains are loaded as the data is delivered to the decompressor. Many different decompression methods can be used. One common choice is a linear finite state machine, where the compressed stimuli are computed by solving linear equations corresponding to internal scan cells with specified positions in partially specified test patterns. Experimental results show that for industrial circuits with test vectors and responses with very low fill rates, ranging from 3% to 0.2%, the test compression based on this method often results in compression ratios of 30 to 500 times. Embedded Deterministic Testing (EDT) is the technology used by Tessent Test Kompress. EDT technology is based on traditional, deterministic A TPG and uses the same fault models to obtain similar test coverage using a familiar flow. EDT extends ATPG with improved compression of scan test data and a reduction in test time. Tessent Test Kompress achieves compression of scan test data by controlling a large number of internal scan chains using a small number of scan channels. Scan channels can be thought of as virtual scan chains because, from the point of view of the tester, they operate exactly the same as traditional scan chains. Therefore, any tester that can apply traditional scan patterns can apply compressed patterns .
Disclaimer: Curated by HT Syndication.
