MUMBAI, India, July 7 -- Intellectual Property India has published a patent application (202641080769 A) filed by Amrita Vishwa Vidyapeetham on June 30, 2026, for A Device And A Method For Monitoring Degradation Of Material Specimens.
Inventors include Nair, Jishnu Suresh; Ramakrishna, Pramod; Eswarachari, Shashi Kumar Marasandra; and Raj, Vishnu.
The application for the patent was published on July 03, 2026, under issue no. 27/2026.
Abstract: The present invention relates to a device and method for monitoring degradation of material specimens using fluid based exposure and sensing. The device may include a vessel configured to hold a liquid medium and at least one material test specimen, a heating unit coupled to the vessel and configured to maintain the liquid medium at an elevated temperature, and one or more optical sensors disposed within the liquid medium and configured to detect changes in optical properties of the liquid medium during exposure of the at least one material test specimen. The detected changes in optical properties may be used as indicators of degradation behavior, for example associated with matrix leaching, resin dissolution, or particulate release into the liquid medium, thereby enabling continuous, in situ assessment of material degradation under controlled liquid exposure conditions. Figure 1 is the representative figure.
Disclaimer: Curated by HT Syndication.
