MUMBAI, India, July 13 -- Intellectual Property India has published a patent application (202641083642 A) filed by Indian Institute Of Information Technology, Design And Manufacturing Iiitdm, Kancheepuram on July 07, 2026, for A Gradient-Based Defect Identification System And Method For Thin-Film Battery Electrode And Electrolyte Layers.
Inventors include Dr. Sirigireddy Pravallika; Dr. K Selvajyothi; and Prof. B Raja.
The application for the patent was published on July 10, 2026, under issue no. 28/2026.
Abstract: “A GRADIENT-BASED DEFECT IDENTIFICATION SYSTEM AND METHOD FOR THIN-FILM BATTERY ELECTRODE AND ELECTROLYTE LAYERS” Disclosed herein is a gradient-based defect identification system (100) for thin-film battery electrode and electrolyte layers. The said system (100) comprises a camera unit (102), an edge computing device (106) executing gradient-based image processing operations, a height-adjustable fixture (108) supporting the camera unit (102) at a predefined standoff distance, and a user device (110) displaying detected defect edges overlaid onto the captured images. The method (600) comprises resizing the captured image and defining a region of interest, converting to grayscale and applying Gaussian blur filtering, computing gradient magnitude using a Sobel operator, comparing against a statistically derived upper threshold to classify surface regions as uniform or non-uniform, and performing Canny edge detection with dual-threshold hysteresis to localize and quantify surface defects including pinholes, streaks, neck-in, air entrainment, chatter, and ribbing. [Shall be published with FIG. 01]
Disclaimer: Curated by HT Syndication.
