MUMBAI, India, June 26 -- Intellectual Property India has published a patent application (202514118166 A) filed by Guangdong Kelongwei Automation Equipment Co. , Ltd. on November 27, 2025, for A Solar Silicon Wafer Inspection All-In-One Machine.
Inventors include Su, Jincai; and Chen, Chunfu.
The application for the patent was published on June 19, 2026, under issue no. 25/2026.
Abstract: The present invention discloses a solar silicon wafer inspection all-in-one machine, comprising a front-end conveying rail, an AOI detection mechanism and an IV detection mechanism, wherein the AOI detection mechanism is positioned between the front-end conveying rail and the IV detection mechanism; at least one segment of silicon wafer conveying rail is arranged on the front-end conveying rail; the AOI detection mechanism includes a four-position turntable, a back AOI detection instrument assembly, a front AOI detection instrument assembly and an AOI detection conveying rail; the IV detection mechanism includes a working platform, an indexing disc assembly and at least one detection mechanism. This solar silicon wafer inspection all-in-one machine is designed for conveying silicon wafers, successively undergoing AOI inspection and IV inspection. Operating automatically, it precisely connects the probe to the grid lines on the silicon wafers, enhancing inspection efficiency and increasing productivity. The all-in-one multi-functional structure meets the demands of both front-end and back-end production.
Disclaimer: Curated by HT Syndication.
