MUMBAI, India, June 22 -- Intellectual Property India has published a patent application (202621048444 A) filed by Jethava Hirenkumar on April 16, 2026, for A System And Method For Optimizing Thermal Conductivity Detector Performance With True Temperature Control For Gas Chromatography Applications.
Inventors include Jethava Hirenkumar; Shah Milind Siddharthbhai; and Jethva Harikrishna Babubhai.
The application for the patent was published on June 12, 2026, under issue no. 24/2026.
Abstract: This invention provides a system and method for optimizing the performance of a Thermal Conductivity Detector (TCD) in Gas Chromatography (GC) applications through true temperature control. The system uses multiple PT100 temperature sensing elements at spatially distributed locations within a GC oven, a custom-designed signal conditioning PCB for temperature acquisition and heater control, and a controller implementing a Proportional-on-Measurement (PoM) PID algorithm where the proportional action P = –Kp × PV(t) acts on the measured temperature rather than the error, eliminating proportional kick. A setpoint ramping module generates a linearly varying temperature profile T_sp(t) = T_start + (R × t) at a programmable ramp rate R. The combined PoM-ramp control achieves temperature linearity of R² = 0.9999, maximum error of 0.31°C, and rate jitter of 2.67°C/min compared to R² = 0.526, 45.57°C error, and 55.64°C/min jitter for simple PoM control. Uniform spatial temperature distribution within the GC oven directly reduces TCD baseline noise, eliminates signal drift, and improves detection sensitivity for pharmaceutical, food, environmental, and petrochemical analytical applications.
Disclaimer: Curated by HT Syndication.
