MUMBAI, India, June 26 -- Intellectual Property India has published a patent application (202641057635 A) filed by Immanual R; Sanjana N; Sheela Sobana Rani; Alan Sahayaraj; Naveenkumar Balasubramaniyan; Senbagapriya Selvan; Kamaleshwaran Perumal; Kalaiselvan Srinivasan; and Prasanna Thangapandi on May 06, 2026, for Ai-Based Automatic Visual Inspection System For Small Scale Msme Manufacturing.
Inventors include Immanual R; Sanjana N; Sheela Sobana Rani; Alan Sahayaraj; Naveenkumar Balasubramaniyan; Senbagapriya Selvan; Kamaleshwaran Perumal; Kalaiselvan Srinivasan; and Prasanna Thangapandi.
The application for the patent was published on June 19, 2026, under issue no. 25/2026.
Abstract: An AI-based automatic visual inspection system (100) for MSME manufacturing comprising a transparent inspection enclosure (102), a part-handling robotic arm (104) with gripper end-effector (116), a first camera robotic arm (106) and second camera robotic arm (108) each carrying high-resolution industrial cameras (110, 112), a diffused LED illumination module (118) with strobe trigger controller (120), and an edge computing platform (122) executing an AI defect detection engine (124). The part-handling arm (104) picks, positions, and reorients the part inside the transparent enclosure (102) while the camera arms (106, 108) capture multi-view images from complementary angular positions. The AI defect detection engine (124) performs deep-learning inference on the multi-view image set to detect and classify surface defects including scratches, cracks, burrs, dimensional deviations, and pits, returning a pass/fail decision with defect location and confidence score. The handling arm (104) sorts the part to accept (128) or reject (130) bins and the data logging module (132) records full inspection traceability metadata. The system achieves inspection cycle times of 8 to 15 seconds, detection accuracy exceeding 92%, and is deployable on low-cost edge hardware making it accessible for small and medium manufacturing enterprises.
Disclaimer: Curated by HT Syndication.