MUMBAI, India, Aug. 12 -- Intellectual Property India has published a patent application (202641090862 A) filed by J. K. K Munirajah College Of Technology Autonomous on July 27, 2026, for An Intelligent Cloud - Based Crop Yield Prediction And Disease Detection System Using Deep Convolutional Neural Networks.
Inventor includes Dr. K. Sridharan.
The application for the patent was published on August 07, 2026, under issue no. 32/2026.
Abstract: ABSTRACT An Intelligent Cloud-Based Crop Yield Prediction and Disease Detection System Using Deep Convolutional Neural Networks The present invention discloses an intelligent cloud-based system for accurate crop yield prediction and early disease detection using deep convolutional neural networks (DCNN). The system integrates IoT-based agricultural sensors, satellite imagery, and historical crop datasets to collect real-time environmental and crop condition data. The collected data is transmitted to a cloud computing platform where advanced DCNN models analyze leaf images and environmental parameters to identify crop diseases and predict expected yield. The system employs automated preprocessing, feature extraction, and classification techniques to ensure high prediction accuracy and timely detection of plant health anomalies. Farmers and agricultural experts can access the analysis results through a user-friendly mobile or web interface, enabling informed decision-making regarding irrigation, fertilization, and pest management. By leveraging artificial intelligence and cloud infrastructure, the proposed system enhances agricultural productivity, reduces crop losses, and supports sustainable farming practices while providing scalable and cost-effective precision agriculture solutions for modem farming environments.
Disclaimer: Curated by HT Syndication.
