MUMBAI, India, Aug. 17 -- Intellectual Property India has published a patent application (202641095032 A) filed by S. Nivedha; Ms. Angel Mary Xess; and Dr. Shweta Dewangan on August 05, 2026, for Artificial Intelligence-Based Electronic System And Method For Automated Industrial Defect Detection And Quality Inspection.
Inventors include S. Nivedha; Ms. Angel Mary Xess; and Dr. Shweta Dewangan.
The application for the patent was published on August 14, 2026, under issue no. 33/2026.
Abstract: An artificial intelligence-based electronic system and method for automated industrial defect detection and quality inspection are disclosed. The system captures product images, preprocesses the images, applies trained AI models to extract features and classify defects, localizes defective regions, determines inspection outcomes, and communicates results to industrial automation equipment, thereby improving inspection accuracy, consistency, and manufacturing efficiency.
Disclaimer: Curated by HT Syndication.
