MUMBAI, India, July 13 -- Intellectual Property India has published a patent application (202621060913 A) filed by Pimpri Chinchwad College Of Engineering, Pune; Pallavi Tushar Nikumbh; Dr. Anuradha Thakare; Om Deshmukh; Piyush Daspute; and Payal Lokhande on May 13, 2026, for Distributed Defect Detection System And Method For Industrial Manufacturing Units.
Inventors include Pallavi Tushar Nikumbh; Dr. Anuradha Thakare; Om Deshmukh; Piyush Daspute; and Payal Lokhande.
The application for the patent was published on July 10, 2026, under issue no. 28/2026.
Abstract: ABSTRACT DISTRIBUTED DEFECT DETECTION SYSTEM AND METHOD FOR INDUSTRIAL MANUFACTURING UNITS The present disclosure relates to a distributed defect detection system and method for industrial systems. The system (100) includes at least one edge device (102) with an imaging unit for capturing product images and a local processing module (104) configured to train a machine learning model locally. A communication interface (106) transmits only model weight parameters to a remote aggregation server (108), which aggregates weights from multiple edge devices (102) to generate an updated global model and deletes the received parameters after aggregation. The updated model is deployed back to the edge device (102) for real-time defect detection. FIG. 1 will be the reference figure.
Disclaimer: Curated by HT Syndication.
