MUMBAI, India, Oct. 26 -- Intellectual Property India has published a patent application (202641121089 A) filed by Rajalakshmi Engineering College Autonomous on October 09, 2026, for Inline Sludge Characterization And Automated Dual-Path Routing Using Moisture-Compensated X- Ray Fluorescence Analysis.
Inventor includes Dr. M. Thangamani.
The application for the patent was published on October 23, 2026, under issue no. 43/2026.
Abstract: Inline Sludge Characterization and Automated Dual-Path Routing Using Moisture- Compensated X-Ray Fluorescence Analysis ABSTRACT This specification describes an apparatus for continuous inline heavy metal analysis of wet dewatered sludge and automated routing to one of two processing paths. A sludge conditioning stage (100) presses dewatered sludge (810) into a controlled-thickness film (140) against an X-ray transparent window (120). An XRF analysis module (200) irradiates the film and detects characteristic fluorescent X-rays from heavy metals. An inline moisture probe (310) reads the moisture content of the sludge in real time, and a matrix correction processor (320) uses the moisture reading to compensate for X-ray absorption and scattering effects of water, producing corrected heavy metal concentrations at sludge moisture levels of 60 to 80%. A routing controller (420) compares the corrected values against configurable regulatory thresholds and drives a diverter valve (410) to send compliant sludge to an aerobic composting module (500) fin soil conditioner production and non-compliant sludge to an anaerobic digestion module (600) for biogas energy recovery. On measurement fault or sensor failure, the controller defaults to the digestion path.
Disclaimer: Curated by HT Syndication.
