MUMBAI, India, July 30 -- Intellectual Property India has published a patent application (202641089038 A) filed by National Institute Of Technology-Warangal on July 21, 2026, for Integration Of Reliability Indicator For Generating A Validated Interpretive Structural Model.
Inventors include Aman Dua; Dr. Ankush Goyal; and Dr. Rishika Chhabra.
The application for the patent was published on July 24, 2026, under issue no. 30/2026.
Abstract: TITLE: INTEGRATION OF RELIABILITY INDICATOR FOR GENERATING A VALIDATED INTERPRETIVE STRUCTURAL MODEL A method for generating a validated interpretive structural model incorporating a reliability indicator has been proposed in the present invention to assess inter-observer agreement. The method receives binary responses from a plurality of domain experts indicating the presence or absence of relationships between pairs of factors. Individual factor relationship matrices are constructed for each observer and aggregated into a combined dataset. A reliability assessment module evaluates the degree of agreement among observers using a multi-rater statistical measure that corrects for chance agreement. The computed reliability indicator is integrated into the structural modelling process to refine, prioritize, and validate inter-factor relationships. The method generates a visual structural representation highlighting confidence levels associated with each relationship as shown in figure-2. The invention enhances robustness, transparency, and decision support in social, economic, business, governance, and techno-managerial applications by systematically embedding statistical reliability into interpretive structural modelling.
Disclaimer: Curated by HT Syndication.
