MUMBAI, India, Oct. 12 -- Intellectual Property India has published a patent application (202511023766 A) filed by Chandigarh Group Of Colleges on March 17, 2025, for Mechanical Exhibit Monitoring System.
Inventors include Dr. Simarpreet Kaur; Dr. Ramanpreet Kaur; Ms. Nidhi Chahal; Ms. Preeti Bansal; Varender Singh; Ritik Sagar; and Sonam.
The application for the patent was published on October 09, 2026, under issue no. 41/2026.
Abstract: A mechanical exhibit monitoring system (100) for continuously monitoring the motion of exhibit (102) using laser system (104). When exhibit (102) moves, the laser beam is deflected, indicating proper function. If the laser beam from laser transmitter (104a) reaches the laser receiver (104b) directly without deflection, it signals a malfunction in exhibit (102). Sensor array (106) monitor parameters for maintaining functioning of exhibit (102). Motion sensor (106a) monitors motion in exhibit (102) detecting complete halts and slow performance. Temperature sensor (106b) measure temperature shift and humidity sensor (106c) keep track of excessive humidity that affect the functioning of exhibit (102). Centralized monitoring system (108) allows for easy access to exhibit (102) status, with alerts to send notifications whenever a fault is detected. User Interface (110) allows for real-time status updates of exhibits (102). AI analyzes patterns of normal operation and deviation, identify potential malfunctions early. FIG. 1
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