MUMBAI, India, Nov. 2 -- Intellectual Property India has published a patent application (202611108647 A) filed by Dr B R Ambedkar National Institute Of Technology, Jalandhar on September 10, 2026, for Multi-Sample Cryogenic Thermal Characterization System For Simultaneous Steady-State And Transient Measurements.
Inventors include Ravi Verma; Lalit Bansal; Ayushi Gupta; Narendra Kumar; Anish Sachdeva; and Richa Sharma.
The application for the patent was published on October 30, 2026, under issue no. 44/2026.
Abstract: Epoxy-filler composite adhesives are widely used in various applications such as the cryogenic and semiconductor industries. However, base epoxies have inherently low thermal conductivities that necessitate the use of filler particles to be dispersed in them. Optimisation of filler particles and particle volume fraction in the given epoxy requires extensive experiments in cryogenic conditions. Testing each sample at ultra-low temperatures is cumbersome and time-consuming and also requires a large amount of cryogenic liquids. The present invention attempts to solve this problem. It comprises a multi-holder cryogenic thermal characterisation system. It simultaneously allows steady-state and transient thermal conductivity and diffusivity measurements. Independent PID-controlled heaters allow different set temperatures for individual samples in a common cryogenic environment. Therefore, through simultaneous characterization of multiple epoxy composite adhesives, the experimental duration and amount of cryogenic liquids required can be substantially reduced. The proposed system provides a cost-effective, and efficient platform for rapid development and optimization of thermally conductive epoxy composites intended for cryogenic applications.
Disclaimer: Curated by HT Syndication.
