MUMBAI, India, Aug. 17 -- Intellectual Property India has published a patent application (202617082923 A) filed by Jfe Steel Corporation on July 06, 2026, for Quality Defect Diagnostic Device And Quality Defect Diagnostic Method.
Inventors include Takagi, Hiroyuki; and Hirata, Takehide.
The application for the patent was published on August 14, 2026, under issue no. 33/2026.
Abstract: This quality defect diagnostic device comprises: a data division unit for dividing product data to be diagnosed in a two-dimensional manner into prescribed blocks; a data aggregation unit for extracting operation data and facility maintenance data for each pre-established classification of quality defects on the basis of the tendency of occurrence of quality defects in the post-division blocks, and aggregating the extracted operation data and facility maintenance data for each region including two or more blocks in a specific direction of the product; and a quality defect determination unit for determining whether a quality defect has occurred by using a plurality of prediction models that are created for each classification of quality defects and are trained on the relationship between quality data and the post-aggregation operation data and facility maintenance data.
Disclaimer: Curated by HT Syndication.
