MUMBAI, India, June 26 -- Intellectual Property India has published a patent application (202617022719 A) filed by Horiba, Ltd. on February 26, 2026, for Specimen Testing System, Information Processing Method, And Computer Program.
Inventors include Tabata, Kunio; Shimura, Miyoko; and Yamamoto, Mitsunobu.
The application for the patent was published on June 19, 2026, under issue no. 25/2026.
Abstract: Provided are a specimen testing system, an information processing method, and a computer program for preventing alteration of data pertaining to measurement. The specimen testing system comprises a measurement device and an information processing device. The measurement device acquires, in accordance with a prescribed rule, a measurement result required to assess the state of a specimen, generates measurement data representing the measurement result, and stores, in association with each other: protected device data that includes device data and a hash vale for the device data, said device data representing a result of testing whether the state of the measurement device follows the prescribed rule; and protected measurement data that includes the measurement data and a hash value for the measurement data.
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