MUMBAI, India, Nov. 2 -- Intellectual Property India has published a patent application (202641126102 A) filed by Vellore Institute Of Technology, Chennai on October 22, 2026, for System And Method For Multi-View Optical Defect Analysis.
Inventors include Ravi Prakash Dwivedi; Ritam Pandey; Sai Mithil K; Shivam Yadav; and Hemant.
The application for the patent was published on October 30, 2026, under issue no. 44/2026.
Abstract: A multi-view optical defect analysis system (100) includes an image acquisition assembly (102) having a plurality of optical imaging units (102A) to acquire image data of a material from multiple viewing directions, an optical inspection unit (104) to generate inspection information from acquired image data, and a controller (106) communicatively coupled thereto. Controller (106) includes one or more processors (106A) and a memory (106B) storing executable instructions that cause controller (106) to receive inspection information through a data acquisition unit (106D-1), correlate inspection information from plurality of viewing directions using a correlation engine (106D-2) to generate correlated inspection information, determine one or more defect characteristics through a defect evaluation engine (106D-3), verify determined defect characteristics across multiple inspection instances using an inspection engine (106D-4), generate defect characterization information through a defect characterization engine (106D-5), to execute operational actions through an operational decision engine (106D-6) based on defect characterization information.
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