MUMBAI, India, Oct. 26 -- Intellectual Property India has published a patent application (202641123783 A) filed by Vellore Institute Of Technology on October 15, 2026, for System For Detecting Externally Assisted Malpractice At A Monitored Assessment Station.
Inventors include Ramani S; and Aditya Sridhar.
The application for the patent was published on October 23, 2026, under issue no. 43/2026.
Abstract: ABSTRACT SYSTEM FOR DETECTING EXTERNALLY ASSISTED MALPRACTICE AT A MONITORED ASSESSMENT STATION An integrity-monitoring system includes a display panel (200) presenting assessment items to a candidate, an airborne acoustic transducer (402), an input-device interface (500) for an input device (505), and a processing unit (150). A photometric sensor (210) receives light from a region (205) of the display panel (200) and produces an onset signal, a contact transducer (400) is coupled to a work surface, and a gating unit (920) is in series with a data path (925). The processing unit (150) derives a presentation instant from the onset signal, an emission instant attributed to the candidate upon threshold coincidence and envelope correlation of the transducers (400, 402), and a commit instant. The processing unit (150) tests bounded consultation and assistance intervals, derives a corroboration value, and, upon an eligibility condition, causes the gating unit (920) to interrupt the data path (925). (Fig. 1)
Disclaimer: Curated by HT Syndication.
