MUMBAI, India, July 31 -- Intellectual Property India has published a patent application (202617066018 A) filed by Sikora AG on May 25, 2026, for Terahertz Measuring Device And Method For Calibrating A Terahertz Measuring Device.
Inventors include Miesner, Sebastian; and Sikora, Harald.
The application for the patent was published on July 24, 2026, under issue no. 30/2026.
Abstract: The invention relates to a terahertz measuring device for measuring the wall thickness of an object, wherein the terahertz measuring device has a terahertz transmitter which can be rotated with a rotating ring or along a rotating ring about a measuring region which accommodates the object during measurement, and a terahertz receiver which can be rotated with the rotating ring or along the rotating ring about the measuring region and which receives terahertz irradiation emitted by the terahertz transmitter onto the object after reflection by an object arranged in the measuring region, and wherein the terahertz measuring device furthermore comprises an evaluation apparatus which is designed to determine a wall thickness of the object from the measuring data of the terahertz receiver. The invention also relates to a method for calibrating such a terahertz measuring device.
Disclaimer: Curated by HT Syndication.
