MUMBAI, India, Aug. 12 -- Intellectual Property India has published a patent application (202617082903 A) filed by Fill Gesellschaft M. B. H. on July 06, 2026, for Test Device For Non-Destructive Material Test And Method For Non-Destructive Material Test.
Inventors include Schiessl, Christian; Gramberger, Thomas; Waldhr, Victor; and Haase, Wolfgang.
The application for the patent was published on August 07, 2026, under issue no. 32/2026.
Abstract: The invention relates to a test device (1) for a non-destructive material test, comprising: - a base (2) having a coupling (4) for connecting to a robot (5); - a first test head (6) which is coupled by means of a first test head carrier (7) to the base (2) in a manner displaceable relative to the base (2); - a second test head (8) which is coupled by means of a second test head carrier (9) to the base in a manner displaceable relative to the base (2), wherein the first test head (6) and the second test head (8) are arranged one behind the other in a longitudinal extension direction (3) of the base (2) and the first test head (6) and the second test head (8) are shaped differently to one another, wherein the test heads (6, 8) have a first test direction (12) which lies parallel to the longitudinal extension direction (3) of the base (2).
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